Automotive Grade Chip Helium Leak Tester

主要特点

Hermetic packaging inspection for automotive-grade chips, sealing verification for power modules (such as IGBTs and SiC), leak testing for MEMS sensor packaging, and leak detection for other electronic components requiring high reliability.

规格参数

IPressure Retention Capability

No leaks after 24 hours of pressure retention during high-pressure helium immersion at a maximum pressure of 0.5 MPa

Core Sensitivity

5*10-13pa·m3/s

Pumping Speed

35m3/h

Maximum Test Port Pressure

13mbar