Automatic Wafer Bonding Void Detection System

主要特点

This system is primarily used to detect the number and size of bubbles (voids) after the bonding process in advanced packaging. Compared to ultrasonic testing, it offers the advantages of high detection accuracy, rapid testing and the elimination of the need for a pure water medium, as well as cost savings.

规格参数

Detection Accuracy<5μm
Substrate MaterialSi、Glass、Sapphire
Warpage≤1mm
WPH ≥6